Back to top
Languages
English
Español
Navigation
Digital Resources
Genealogy
Remote Printing
Sign in
Your Account
Library Home Page
Library Hours & Location
Classic Catalog
Languages
English
Español
Sign Out
Look for
Keyword
Title
Start of Title
Series
Author
Subject
Call Number
Advanced Search
in Library Catalog
in Lists
in Library Website
in Combined Results
Search
Filters
Main Navigation
Filter Results
Narrow Your Results
Fiction / Non-Fiction
Non Fiction (19)
Not Coded (2)
Audience
Unknown (12)
General (9)
Format
Book (20)
Serial (1)
Author
Medley, Glenn W
(2)
Beatty, Robert William, 1917
(1)
Buehler, Martin G
(1)
Goodman, Alvin M
(1)
Graham, Kennard Codville, 1895
(1)
more ...
Genre
Handbooks, manuals, etc
(2)
Abstracts
(1)
Bibliography
(1)
Catalogs
(1)
Congresses
(1)
more ...
Periodicals
(1)
Statistics
(1)
less ...
Series
NBS special publication (4)
NBS technical note (4)
NBS monograph (3)
Semiconductor measurement technology (3)
AR Reading Level
AR Reading Level from
AR Reading Level to
AR Point Value
AR Point Value from
AR Point Value to
Subject
Electric measurements (13)
Electric measurements -- Data processing (2)
Electric measurements -- Handbooks, manuals, etc (2)
Electric units (2)
Electrical engineering -- Standards (2)
more ...
Language
English (21)
Publication Date
Publication Date from
Publication Date to
Published in the last
year
•
5 years
•
10 years
User Rating
(0)
(0)
(0)
(0)
(0)
Unrated
(21)
Lexile measure
Lexile measure from
Lexile measure to
Browse
»
Catalog Search
»
Showing 1 - 20 of 21
Catalog Search Results
Books
(21)
Entire Evergreen Indiana Collection (21)
Available Now (21)
Sort by
Best Match
Publication Year Desc
Publication Year Asc
Author
Title
Date Purchased Desc
Call Number
Total Checkouts
User Rating
Number of Holds
Hide Covers
Covers
List
Search Tools
Save Search
Email this Search
Get RSS Feed
Export To CSV
Export To RIS
Search Tools
1)
Report of tests on Joseph Newman's device
Author
Hebner, R. E
Series
NBSIR
volume 86-3405
Pub. Date
[1986]
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
2)
A peak AC-DC voltage comparator for use in a standards laboratory
Author
Marzetta, L. A
Series
NBS technical note
volume 280
Pub. Date
1966.
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
3)
The design and operation of a high voltage calibration facility
Author
Scott, Winston W
Series
NBS technical note
volume 349
Pub. Date
1966.
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
4)
Superconducting quantum interference devices: an operational guide for rf-biased systems
Author
Sullivan, D. B
Series
NBS technical note
volume 629
Pub. Date
1972.
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
5)
Critical electrical measurement needs and standards for modern electronic instrumentation: report of a workshop sponsored by the National Bureau of Standards, Gaithersburg, Md., Sept. 23-24, 1974
Series
NBS technical note
volume 865
Pub. Date
1975.
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
6)
The measurement of lumped parameter impedance: a metrology guide
Author
Jones, Raymond N
Series
NBS monograph
volume 141
Pub. Date
1974.
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
7)
BOLOVAC systems for measuring electrical quantities from 0.5 MHz through microwaves
Author
Selby, Myron C
Series
NBS monograph
volume 123
Pub. Date
1972.
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
8)
Safe operation of capacitance meters using high applied-bias voltage
Author
Goodman, Alvin M
Series
Semiconductor measurement technology
NBS special publication
Pub. Date
1976.
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
9)
Electrical measurement of plating thickness
Author
Mustapha, J. B
Series
BDX ; 613-1942
Pub. Date
1978.
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
10)
Fundamentals of electricity
Author
Graham, Kennard Codville, 1895
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
11)
Automatic measurement of network parameters: a survey
Author
Beatty, Robert William
Series
NBS monograph
volume 151
Pub. Date
1976.
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
12)
Electrical engineering units and constants
Author
United States. National Bureau of Standards
Series
NBS special publication
Pub. Date
1977.
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
13)
Electrical engineering units and constants, as adapted by NBS
Series
National Bureau of Standards miscellaneous publication
volume 268
Pub. Date
1965.
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
14)
Electrical and electronic properties measuring and testing instruments
Author
United States. Defense Logistics Agency
Series
Industrial plant equipment handbook
DLAH
Pub. Date
1978.
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
15)
Defects in PN junctions and MOS capacitors observed using thermally simulated current and capacitance measurements--video script
Author
Buehler, Martin G
Series
Semiconductor measurement technology
NBS special publication
Pub. Date
1976.
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
16)
Precision measurement equipment laboratory specialist (AFSC 32450)
Author
Medley, Glenn W
Pub. Date
1985
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
17)
Perimeter sensor evaluation at a 500-kv substation
Author
Griffith, R. D
Series
SAND ; 78-1369
Pub. Date
1978
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
18)
Precision measurement equipment laboratory technician (AFSC 32470)
Author
Medley, Glenn W
Pub. Date
1985
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
19)
Semiconductor measurement technology: BASIC program for calculating dopant density profiles from capacitance-voltage data
Author
Mattis, Richard L
Series
Semiconductor measurement technology
NBS special publication
volume 400-11
Pub. Date
1975.
Language
English
Book
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
More Info
Add to List
SHARE
20)
Electromagnetic metrology
Pub. Date
1970
Language
English
Serial
Show Edition
Available from another library
Where is it?
See Full Copy Details
Place Hold
Description
Read Description
Abstracts of selected articles on measurement techniques and standards of electromagnetic quantities from D-C to millimeter-wave frequencies.
More Info
Add to List
SHARE
1
2
Next »
[2]
Didn't find it?
Can't find what you are looking for? Try our Materials Request Service.
Submit Request
Loading, please wait
...
Chat with us
, powered by
LiveChat